`R/BSDA-package.R`

`Chips.Rd`

Data for Exercise 10.9

`Chips`

A data frame/tibble with 30 observations on eight variables

- wafer11
first measurement of thickness of the oxide layer for

`wafer1`

- wafer12
second measurement of thickness of the oxide layer for

`wafer1`

- wafer13
third measurement of thickness of the oxide layer for

`wafer1`

- wafer14
fourth measurement of thickness of the oxide layer for

`wafer1`

- wafer21
first measurement of thickness of the oxide layer for

`wafer2`

- wafer22
second measurement of thickness of the oxide layer for

`wafer2`

- wafer23
third measurement of thickness of the oxide layer for

`wafer2`

- wafer24
fourth measurement of thickness of the oxide layer for

`wafer2`

Yashchin, E. 1995. “Likelihood Ratio Methods
for Monitoring Parameters of a Nested Random Effect Model.”
*Journal of the American Statistical Association*, 90, 729-738.

Kitchens, L. J. (2003) *Basic Statistics and Data Analysis*.
Pacific Grove, CA: Brooks/Cole, a division of Thomson Learning.